Our collaboration with NPL has produced an important breakthrough in reducing the time it takes to carry out measurements of semiconductor electron pumps. A new machine learning algorithm has been developed for automatically tuning and characterising single-electron pump devices in a multiplexed array. An approximately 8-fold reduction in data acquisition time was demonstrated with the automatic framework. As the number of devices needed in parallel for the practical realisation of the ampere scales up, automatic frameworks such as this one will become increasingly sought after in the field.

This work has just been accepted for publication in a Special Issue of Applied Physics Letters dedicated to Quantum Metrology. Furthermore, the manuscript has been selected as an Editor’s Choice and it features on the Cover Page of the 16/9/2024 Issue.

More info on this work is available here.